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Volumn 118, Issue 3, 1996, Pages 425-431

Diagnostic modeling and diagnosability evaluation of mechanical systems

Author keywords

[No Author keywords available]

Indexed keywords

CONTROL SYSTEMS; FAILURE ANALYSIS; MATHEMATICAL MODELS; MECHANICAL TESTING; PROBABILITY;

EID: 0030245354     PISSN: 10500472     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.2826903     Document Type: Article
Times cited : (23)

References (9)
  • 1
    • 85025220607 scopus 로고
    • Maintainability Design Techniques, Department of Defense, Washington, DC
    • Dod, T., 1988, Handbook 791, Maintainability Design Techniques, Department of Defense, Washington, DC.
    • (1988) Handbook 791
    • Dod, T.1
  • 2
    • 3643127284 scopus 로고
    • Maintainability, and Testability, TAB Books, Blue Ridge Summit, PA
    • Jones, J. v., 1988, Engineering Design: Reliability, Maintainability, and Testability, TAB Books, Blue Ridge Summit, PA
    • (1988) Engineering Design: Reliability
    • Jones, J.V.1
  • 3
    • 24044449042 scopus 로고
    • Techniques of Estimating Reliability at Design Stage
    • W. G. Ireson and C. F Coombs, Jr., eds., McGraw-Hill, New York
    • Kapur, K. C, 1988, “Techniques of Estimating Reliability at Design Stage,” Handbook of Reliability Engineering and Management, W. G. Ireson and C. F Coombs, Jr., eds., McGraw-Hill, New York.
    • (1988) Handbook of Reliability Engineering and Management
    • Kapur, K.C.1
  • 4
    • 0026267429 scopus 로고
    • A New Low Overhead Design for Testability of Programmable Logic Arrays
    • Liu, B. D., and Sheu, J. J., 1991 “A New Low Overhead Design for Testability of Programmable Logic Arrays,” IEEE International Symposium on Circuit Systems, Vol. 4, pp. 1972-75.
    • (1991) IEEE International Symposium on Circuit Systems , vol.4 , pp. 1972-1975
    • Liu, B.D.1    Sheu, J.J.2
  • 7
    • 0005380081 scopus 로고
    • Fault Isolation BITE for Increased Productivity
    • 1982, Institute of Electrical and Electronics Engineers, New York
    • Stander, C, 1982, “Fault Isolation BITE for Increased Productivity,” Proceedings, Annual Reliability and Maintainability Symposium 1982, Institute of Electrical and Electronics Engineers, New York, pp. 365-369.
    • (1982) Proceedings, Annual Reliability and Maintainability Symposium , pp. 365-369
    • Stander, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.