Scaling properties of metal-semiconductor-metal photodetectors

Semiconductor Science and Technology

Volumn 11, Issue 9, 1996, Pages 1322-1327

  Wilson, S P ^a   Walker, A B ^a  

^a UNIVERSITY OF EAST ANGLIA   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER; ELECTRIC FIELD EFFECTS; LIGHTING; MATHEMATICAL MODELS; PHOTODIODES;

CARRIER MOBILITY; CONTACT SEPARATION; DRIFT DIFFUSION MODEL; METAL SEMICONDUCTOR METAL PHOTODETECTORS; OPTICAL ILLUMINATION; RECOMBINATION LIFETIME; SCALING PROPERTIES; STEADY STATE RESPONSE;

PHOTODETECTORS;

EID: 0030245309     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/11/9/013     Document Type: Article

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