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Volumn 19, Issue 3, 1996, Pages 288-294

A study of field-assisted silver migration in a low temperature cofirable ceramic tape system

Author keywords

Buried Capacitors; Electron Microscopy; Low Temperature Cofired Ceramics (LTCC); Reliability; Silver Migration; X ray Microanalysis

Indexed keywords

AGING OF MATERIALS; CAPACITORS; CERAMIC MATERIALS; CONDUCTIVE MATERIALS; ELECTRONICS PACKAGING; LOW TEMPERATURE PROPERTIES; METALLIZING; SCANNING ELECTRON MICROSCOPY; SILVER; THERMAL DIFFUSION IN SOLIDS; THERMAL EFFECTS; X RAY ANALYSIS;

EID: 0030245138     PISSN: 10631674     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (1)

References (11)
  • 5
    • 0016552288 scopus 로고
    • Silver Migration in Glass Dams between Silver-Palladium Interconnections
    • September
    • George J. Kahan, "Silver Migration in Glass Dams Between Silver-Palladium Interconnections," IEEE Transactions on Electrical Insulation, Vol. EI-10, No. 3, pp. 86-94, September 1975.
    • (1975) IEEE Transactions on Electrical Insulation , vol.EI-10 , Issue.3 , pp. 86-94
    • Kahan, G.J.1
  • 6
    • 0018258984 scopus 로고
    • Optical Waveguides Fabricated by Electric-Field Controlled Ion Exchange in Glass
    • March 2
    • G.H. Chartier, P. Jaussaud, A.D. de Olveira, and O. Parriaux, "Optical Waveguides Fabricated by Electric-Field Controlled Ion Exchange in Glass," Electronics Letters, Vol. 14, No. 5, pp. 132-134, March 2, 1978.
    • (1978) Electronics Letters , vol.14 , Issue.5 , pp. 132-134
    • Chartier, G.H.1    Jaussaud, P.2    De Olveira, A.D.3    Parriaux, O.4
  • 7
    • 0020205839 scopus 로고
    • Field-Induced Index Profiles of Multimode Ion-Exchanged Strip Waveguides
    • November
    • Hans Lilienhof, Edgar Voges, Dittmar Ritter, and Blagoy Pantschew, "Field-Induced Index Profiles of Multimode Ion-Exchanged Strip Waveguides," IEEE Journal of Quantum Electronics, Vol. QE-18, No. 11, pp. 1877-1882, November, 1982.
    • (1982) IEEE Journal of Quantum Electronics , vol.QE-18 , Issue.11 , pp. 1877-1882
    • Lilienhof, H.1    Voges, E.2    Ritter, D.3    Pantschew, B.4
  • 9
    • 0041628218 scopus 로고
    • Environmental Durability of Silver Multilayer Circuits
    • Boston, Massachusetts, November 15-17
    • Christopher Needes, "Environmental Durability of Silver Multilayer Circuits," Proceedings of the International Symposium on Microelectronics (ISHM), Boston, Massachusetts, November 15-17, pp. 173-178, 1994.
    • (1994) Proceedings of the International Symposium on Microelectronics (ISHM) , pp. 173-178
    • Needes, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.