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Volumn 19, Issue 3, 1996, Pages 288-294
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A study of field-assisted silver migration in a low temperature cofirable ceramic tape system
a a,b,c,d |
Author keywords
Buried Capacitors; Electron Microscopy; Low Temperature Cofired Ceramics (LTCC); Reliability; Silver Migration; X ray Microanalysis
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Indexed keywords
AGING OF MATERIALS;
CAPACITORS;
CERAMIC MATERIALS;
CONDUCTIVE MATERIALS;
ELECTRONICS PACKAGING;
LOW TEMPERATURE PROPERTIES;
METALLIZING;
SCANNING ELECTRON MICROSCOPY;
SILVER;
THERMAL DIFFUSION IN SOLIDS;
THERMAL EFFECTS;
X RAY ANALYSIS;
ENERGY DISPERSIVE X RAY MICROANALYSIS;
FIELD ASSISTED SILVER MIGRATION;
LOW TEMPERATURE COFIRED CERAMIC TAPE SYSTEMS;
SILVER CONDUCTIVE INKS;
SILVER MIGRATION;
TAPES;
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EID: 0030245138
PISSN: 10631674
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (1)
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References (11)
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