Auger electron spectroscopy study on the Cr/Al2O3 interfacial reactions

Applied Physics A: Materials Science and Processing

Volumn 63, Issue 3, 1996, Pages 277-281

  Lu, Hua ^a   Shen, D H ^a   Bao, C L ^a   Cui, Y D ^a   Qin, J ^a  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ANNEALING; AUGER ELECTRON SPECTROSCOPY; CHARGE TRANSFER; CHROMIUM; ELECTRON ENERGY LEVELS; MONOLAYERS; OXIDATION; OXIDES; REACTION KINETICS; SUBSTRATES; SURFACE STRUCTURE;

AUGER ELECTRON KINETIC ENERGY; AUGER PEAK TO PEAK HEIGHT; CHEMICAL SHIFT; CHROMIUM OXIDE; INTERFACIAL REACTIONS;

INTERFACES (MATERIALS);

EID: 0030244833     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390050384     Document Type: Article

References (9)