Fault-based testing and diagnosis of balanced filters

Analog Integrated Circuits and Signal Processing

Volumn 11, Issue 1, 1996, Pages 5-19

  Mir, S ^a   Lubaszewski, M ^b   Kolarik, V ^c   Courtois, B ^a,d  

^a TIMA LABORATORY   (France)

^b FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

^c BRNO UNIVERSITY OF TECHNOLOGY   (Czech Republic)

^d CMP Service

Author keywords

Analogue; ATPG; Balanced filters; BIST; Fault diagnosis

Indexed keywords

ELECTRIC NETWORK SYNTHESIS; FAILURE ANALYSIS; NETWORK COMPONENTS; OBSERVABILITY; SIGNAL PROCESSING; SIGNAL TO NOISE RATIO; STANDARDS;

BALANCED FILTERS; BOUNDARY SCAN TESTING; BUILT IN SELF TEST; DIFFERENTIAL ANALOG FILTERS; FAULT COVERAGE; FAULT TESTING; HARD SOFT FAULTS;

ELECTRIC FILTERS;

EID: 0030244281     PISSN: 09251030     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF00174235     Document Type: Article

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