Characterization of surface morphology in epitaxial growth

Surface Science

Volumn 365, Issue 1, 1996, Pages 177-185

  Amar, Jacques G ^a   Family, Fereydoon ^a  

^a EMORY UNIVERSITY   (United States)

Author keywords

Computer simulations; Growth; Iron; Low energy electron diffraction (LEED); Morphology; Reflection high energy electron diffraction (RHEED); Roughness and topography; Single crystal surfaces; Surface roughening; Surface structure

Indexed keywords

CALCULATIONS; CHARACTERIZATION; COMPUTER SIMULATION; IRON; LOW ENERGY ELECTRON DIFFRACTION; MORPHOLOGY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SINGLE CRYSTALS; SURFACE ROUGHNESS; SURFACES;

SELF AFFINE SURFACE; SINGLE CRYSTAL SURFACES; SURFACE TOPOGRAPHY;

EPITAXIAL GROWTH;

EID: 0030244005     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00692-9     Document Type: Article

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