Reliability analysis of a complex system with a deteriorating standby unit under common-cause failure and critical human error

Microelectronics Reliability

Volumn 36, Issue 9, 1996, Pages 1287-1290

  Narmada, S ^a   Jacob, M ^a  

^a MAHATMA GANDHI UNIVERSITY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ERRORS; FAILURE ANALYSIS; LARGE SCALE SYSTEMS; MATHEMATICAL MODELS; PROBABILITY; RANDOM PROCESSES; RELIABILITY THEORY; REPAIR; SYSTEMS ANALYSIS;

COMMON CAUSE FAILURE; CRITICAL HUMAN ERROR; POINTWISE AVAILABILITY; STANDBY UNIT; STEADY STATE AVAILABILITY; TRANSITION TIME;

MICROELECTRONICS;

EID: 0030243039     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/0026-2714(95)00132-8     Document Type: Article

References (1)

1. D. Pandey and Jacob Mendus, Cost analysis availability and MTTF of a three state standby complex system under common cause and human failures, Microelectron. Reliab. 35(1), 91-95 (1994).