The use of EXAFS spectroscopy to show the structural modifications in metals implanted with N+ ions

Surface and Coatings Technology

Volumn 83, Issue 1-3, 1996, Pages 109-114

  Fernandez A ^a   Caballero, A ^a   Jimenez V ^a   Sanchez J C ^a   Gonzalez Elipe A R ^a   Alonso, F ^b   Onate J I ^b  

^a INSTITUTO DE CIENCIA DE MATERIALES DE SEVILLA   (Spain)

^b TECNALIA RESEARCH AND INNOVATION   (Spain)

Author keywords

Amorphization of metals; EXAFS; N+ implantation; Ta; Ti

Indexed keywords

ABSORPTION SPECTROSCOPY; AMORPHIZATION; CHEMICAL BONDS; CHEMICAL MODIFICATION; COMPOSITION EFFECTS; ELECTRON ENERGY LEVELS; FILM GROWTH; ION BOMBARDMENT; METALLIC FILMS; NITROGEN; TANTALUM COMPOUNDS; TITANIUM COMPOUNDS;

STRUCTURAL MODIFICATIONS; X RAY ABSORPTION SPECTROSCOPY;

ION IMPLANTATION;

EID: 0030243014     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/0257-8972(95)02812-9     Document Type: Article

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