메뉴 건너뛰기




Volumn 13, Issue 3, 1996, Pages 79-87

Design for testability in hardware-software

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER ARCHITECTURE; COMPUTER HARDWARE; COMPUTER SOFTWARE; COMPUTER TESTING; HIGH LEVEL LANGUAGES; LARGE SCALE SYSTEMS;

EID: 0030242494     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/54.536098     Document Type: Article
Times cited : (18)

References (23)
  • 1
    • 0028464667 scopus 로고
    • Hardware-Software Co-Design of Embedded Systems
    • IEEE, Piscataway, N.J.
    • W.H. Wolf, "Hardware-Software Co-Design of Embedded Systems," Proc. IEEE, Vol. 82, No. 7, IEEE, Piscataway, N.J., 1994, pp. 967-989.
    • (1994) Proc. IEEE , vol.82 , Issue.7 , pp. 967-989
    • Wolf, W.H.1
  • 2
    • 0029267089 scopus 로고
    • Specification and Design of Embedded Hardware- Software Systems
    • Spring
    • D.D. Gajski and F. Vahid, "Specification and Design of Embedded Hardware- Software Systems," IEEE Design & Test of Computers, Vol. 12, No. 1, Spring 1995, pp. 53-67.
    • (1995) IEEE Design & Test of Computers , vol.12 , Issue.1 , pp. 53-67
    • Gajski, D.D.1    Vahid, F.2
  • 3
    • 3743142533 scopus 로고
    • System-Level Testability of Hardware/Software Systems
    • IEEE CS Press
    • H.P.E. Vranken et al., "System-Level Testability of Hardware/Software Systems," Proc. Int'l Test Conf., IEEE CS Press, 1994, pp. 134-142.
    • (1994) Proc. Int'l Test Conf. , pp. 134-142
    • Vranken, H.P.E.1
  • 7
    • 0027799145 scopus 로고
    • A Universal Framework for Managed Built-in Test
    • IEEE Computer Society Press, Los Alamitos, Calif.
    • C. Maunder, "A Universal Framework for Managed Built-in Test," Proc. Int'l Test Conf., IEEE Computer Society Press, Los Alamitos, Calif., 1993, pp. 21-29.
    • (1993) Proc. Int'l Test Conf. , pp. 21-29
    • Maunder, C.1
  • 8
    • 0027556721 scopus 로고
    • A Tutorial on Built-in Self-Test, Part 1: Principles
    • Mar.
    • V.D. Agrawal, C.R. Kime, and K.K. Saluja, "A Tutorial on Built-in Self-Test, Part 1: Principles," IEEE Design & Test of Computers, Vol. 10, No. 1, Mar. 1993, pp. 73- 82.
    • (1993) IEEE Design & Test of Computers , vol.10 , Issue.1 , pp. 73-82
    • Agrawal, V.D.1    Kime, C.R.2    Saluja, K.K.3
  • 9
    • 0027610022 scopus 로고
    • A Tutorial on Built-in Self-Test, Part 2: Applications
    • June
    • V.D. Agrawal, C.R. Kime, and K.K. Saluja, "A Tutorial on Built-in Self-Test, Part 2: Applications," IEEE Design & Test of Computers, Vol. 10, No. 2, June 1993, pp. 69-77.
    • (1993) IEEE Design & Test of Computers , vol.10 , Issue.2 , pp. 69-77
    • Agrawal, V.D.1    Kime, C.R.2    Saluja, K.K.3
  • 11
    • 0027796532 scopus 로고
    • Hierarchically Accessing 1149.1 Applications in a System Environment
    • IEEE CS Press
    • L. Whetsel, "Hierarchically Accessing 1149.1 Applications in a System Environment," Proc. Int'l Test Conf., IEEE CS Press, 1993, pp. 517-526.
    • (1993) Proc. Int'l Test Conf. , pp. 517-526
    • Whetsel, L.1
  • 18
    • 0029503766 scopus 로고
    • OSI Test Management: An Introduction
    • Winter
    • R. McRee, "OSI Test Management: An Introduction," IEEE Design & Test of Computers, Vol. 12, No. 4, Winter 1995, pp. 68-80.
    • (1995) IEEE Design & Test of Computers , vol.12 , Issue.4 , pp. 68-80
    • McRee, R.1
  • 20
    • 0022106277 scopus 로고
    • A Knowledge-Based System for Designing Testable VLSI Chips
    • Aug.
    • M.S. Abadir and MA. Breuer, "A Knowledge-Based System for Designing Testable VLSI Chips," IEEE Design & Test of Computers, Vol. 2, No. 4, Aug. 1985, pp. 56-68.
    • (1985) IEEE Design & Test of Computers , vol.2 , Issue.4 , pp. 56-68
    • Abadir, M.S.1    Breuer, M.A.2
  • 21
    • 0027801442 scopus 로고
    • Structure and Metrology for an Analog Testability Bus
    • IEEE CS Press
    • K.P. Parker, J.E. McDermid, and S. Oresjo, "Structure and Metrology for an Analog Testability Bus," Proc. Int'l Test Conf., IEEE CS Press, 1993, pp. 309-322.
    • (1993) Proc. Int'l Test Conf. , pp. 309-322
    • Parker, K.P.1    McDermid, J.E.2    Oresjo, S.3
  • 23
    • 0028126131 scopus 로고
    • ATM Broadband Testing Using the Ferry Principle
    • North-Holland, Amsterdam
    • M.F. Witteman and R.C. van Wuijtswinkel, "ATM Broadband Testing Using the Ferry Principle," Protocol Test Systems VI, North-Holland, Amsterdam, 1994, pp. 125-138.
    • (1994) Protocol Test Systems VI , pp. 125-138
    • Witteman, M.F.1    Van Wuijtswinkel, R.C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.