Characteristics of conductive SrRuO3 thin films with different microstructures

Journal of Materials Research

Volumn 11, Issue 9, 1996, Pages 2263-2268

  Jia, Q X ^a   Chu, F ^a   Adams, C D ^a   Wu, X D ^a   Hawley, M ^a   Cho, J H ^a   Findikoglu, A T ^a   Foltyn, S R ^a   Smith, J L ^a   Mitchell, T E ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; DEPOSITION; ELECTRIC CONDUCTIVITY; EPITAXIAL GROWTH; LANTHANUM COMPOUNDS; PULSED LASER APPLICATIONS; STRONTIUM COMPOUNDS; THERMAL EFFECTS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

CRYSTALLINITY; RESIDUAL RESISTIVITY RATIO; TUNNELING ELECTRON MICROSCOPY;

CONDUCTIVE FILMS;

EID: 0030242005     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1996.0287     Document Type: Article

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