Confidence limits for steady-state availability of systems with a mixture of exponential and gamma operating time and lognormal repair time

Microelectronics Reliability

Volumn 36, Issue 9, 1996, Pages 1303-1304

  Chandrasekhar, P ^a   Natarajan, R ^b  

^a LOYOLA COLLEGE   (India)

^b PRESIDENCY COLLEGE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

AVAILABILITY; PARAMETER ESTIMATION; PROBABILITY DENSITY FUNCTION; RANDOM PROCESSES; REPAIR; STATISTICAL METHODS; SYSTEMS ANALYSIS; WEIBULL DISTRIBUTION;

CONFIDENCE INTERVAL; CONFIDENCE LIMITS; EXPONENTIAL OPERATING TIME; GAMMA OPERATING TIME; LOGNORMAL REPAIR TIME; STEADY STATE AVAILABILITY;

RELIABILITY THEORY;

EID: 0030241716     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/0026-2714(95)00165-4     Document Type: Article

References (5)

1. M. Thompson, Lower confidence limits and a test of hypotheses for system availability, IEEE Trans. Reliab. R.15, 32-36 (1966).
2. H. L. Gray and T. O. Lewis, A confidence interval for the availability ratio, Technometrics 9, 465 (1967).
3. R. W. Butterworth and T. Nickolaisen, Bounds on the availability function, Naval Res. Logistics Quart. 20, 289-296 (1973).
4. B. N. Masters and T. O. Lewis, A note on the confidence interval for the availability ratio, Microelectron. Reliab. 27, 487-492 (1987).
5. B. N. Masters, T. O. Lewis and W. J. Kolarik, A note on the confidence interval for the availability ratio for systems with Weibull operating time and lognormal repair time, Microelectron. Reliab. 32, 89-99 (1992).