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Volumn 6, Issue 5, 1996, Pages

Field emission from As-grown and ion-beam-sharpened diamond particles deposited on silicon tips

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; ELECTRIC FIELDS; ELECTRON EMISSION; ELECTRONS; ION BEAMS; ION BOMBARDMENT; IONS; MILLING (MACHINING); SILICON;

EID: 0030235503     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:1996516     Document Type: Article
Times cited : (3)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.