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Volumn 6, Issue 5, 1996, Pages

Peculiarities of the field emission with porous Si surfaces, covered by ultrathin DLC films

Author keywords

[No Author keywords available]

Indexed keywords

ARRAYS; CARBON; ELECTRON EMISSION; ELECTRONS; ESTIMATION; ETCHING; ETHANOL; POROUS SILICON; SILICON WAFERS; SURFACES;

EID: 0030235502     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:1996519     Document Type: Article
Times cited : (5)

References (15)
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    • 5544281479 scopus 로고
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    • USA,San-Francisco, April 17-21, 1995 Abstracts
    • Evtukh A.A., Litovchenko V.G., Marchenko R.I. and Romanuyk B.N., "Field emitter tip arrays with high efficiency for flat panel display application", MRS Spring Meeting, USA,San-Francisco, April 17-21, 1995 (Abstracts, 1995) p. 396.
    • (1995) MRS Spring Meeting , pp. 396
    • Evtukh, A.A.1    Litovchenko, V.G.2    Marchenko, R.I.3    Romanuyk, B.N.4
  • 3
    • 0029548065 scopus 로고
    • Characterization of porous silicon field emitter properties
    • The 8th Int. Vac. Microelectron. Conf., USA, Portland, July 30-August 3, 1995
    • Boswell E.C., Huang M., Smith G.D.W. and Wislaw P.R., "Characterization of porous silicon field emitter properties", The 8th Int. Vac. Microelectron. Conf., USA, Portland, July 30-August 3, 1995 (Technical Digest ,1995) pp. 37-41.
    • (1995) Technical Digest , pp. 37-41
    • Boswell, E.C.1    Huang, M.2    Smith, G.D.W.3    Wislaw, P.R.4
  • 4
    • 0029547499 scopus 로고
    • Porous silicon field emission cathode development
    • The 8th Int. Vac. Microelectron. Conf., USA, Portland, July 30-August 3, 1995
    • Jessing J.R., Parker D.L. and Weichold M.H., "Porous silicon field emission cathode development", The 8th Int. Vac. Microelectron. Conf., USA, Portland, July 30-August 3, 1995 (Technical Digest, 1995) pp. 32-36.
    • (1995) Technical Digest , pp. 32-36
    • Jessing, J.R.1    Parker, D.L.2    Weichold, M.H.3
  • 5
    • 0029492947 scopus 로고
    • Parameters of the tip arrays covered by low work function layers
    • The 8th Int. Vac. Microelectron. Conf., USA, Portland, July 30-August 3, 1995
    • Evtukh A.A., Litovchenko V.G., Marchenko R.I., Klyui N.I., Semenovich V.A. and Nelep C., "Parameters of the tip arrays covered by low work function layers", The 8th Int. Vac. Microelectron. Conf., USA, Portland, July 30-August 3, 1995 (Technical Digest, 1995) pp. 529-539.
    • (1995) Technical Digest , pp. 529-539
    • Evtukh, A.A.1    Litovchenko, V.G.2    Marchenko, R.I.3    Klyui, N.I.4    Semenovich, V.A.5    Nelep, C.6
  • 6
    • 5344253671 scopus 로고
    • Calculation of electron field emission from diamond surfaces
    • France, Grenoble , July 4-7, 1994 ATRIA, Grenoble, France
    • Huang Z.-H., Cutler P.H., Miskovcky N.M. and Sillivan T.E., "Calculation of electron field emission from diamond surfaces", The 7th Int. Vac. Microel. Conf., France, Grenoble , July 4-7, 1994 (ATRIA, Grenoble, France, 1994 ) pp. 92-95.
    • (1994) The 7th Int. Vac. Microel. Conf. , pp. 92-95
    • Huang, Z.-H.1    Cutler, P.H.2    Miskovcky, N.M.3    Sillivan, T.E.4
  • 7
    • 5344232498 scopus 로고
    • Field emission from p-type polycrystalline diamond films
    • France, Grenoble, July 4-7, 1994 ATRIA, Grenoble, France
    • Hong D. and Aslam M., "Field emission from p-type polycrystalline diamond films", The 7th Int. Vac. Microel. Conf., France, Grenoble, July 4-7, 1994 (ATRIA, Grenoble, France, 1994 ) pp. 96-99.
    • (1994) The 7th Int. Vac. Microel. Conf. , pp. 96-99
    • Hong, D.1    Aslam, M.2
  • 14
    • 0004005306 scopus 로고
    • A Wiley-Interscience Publication John Wiley & Sons, New York
    • Sze S.M., Physics of Semiconductor Devices, (A Wiley-Interscience Publication John Wiley & Sons, New York, 1981).
    • (1981) Physics of Semiconductor Devices
    • Sze, S.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.