Medium energy ion scattering (MEIS) studies on Si/GaSb/Si- and Si/CaF 2 /Si(111) layer systems

Applied Surface Science

Volumn 104-105, Issue , 1996, Pages 661-668

  Tappe, T ^a   Chatziparaskewas, A ^a   Schaffer J ^a   Schlosser, J ^a   Schmalhorst, J ^a   Schmiedeskamp, B ^a  

^a BIELEFELD UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CALCIUM COMPOUNDS; FLUORINE COMPOUNDS; HETEROJUNCTIONS; LATTICE CONSTANTS; MOLECULAR BEAM EPITAXY; MONOLAYERS; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTING SILICON; THERMAL EFFECTS;

INTERLAYERS;

SEMICONDUCTING ANTIMONY COMPOUNDS;

EID: 0030235371     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(96)00221-8     Document Type: Article

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