Temporal stability of vapor-deposited molecular films as studied by laser light scattering

Thin Solid Films

Volumn 284-285, Issue , 1996, Pages 581-584

  Oelkrug, D ^a   Haiber, J ^a   Lege, R ^a   Stauch, H ^a   Egelhaaf, H J ^a  

^a UNIVERSITY OF TÜBINGEN   (Germany)

Author keywords

Aggregation; Film morphology; Laser light scattering; Vapour deposited organic films

Indexed keywords

AGGLOMERATION; CRYSTAL GROWTH; DIFFUSION; DIFFUSION IN SOLIDS; LIGHT INTERFERENCE; MOLECULAR STRUCTURE; MORPHOLOGY; NUCLEATION; SCANNING ELECTRON MICROSCOPY; SPECKLE; SUBSTRATES;

ANGULAR RESOLVED LASER SCATTERING; INTEGRAL LASER SCATTERING; LASER LIGHT SCATTERING; TIME RESOLVED SPECKLE INTERFERENCE PATTERN;

ULTRATHIN FILMS;

EID: 0030235021     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(95)08394-4     Document Type: Article

References (8)

1. See, for example, R. Jones and C. Wykes, Holographic and Speckle Interferometry, Cambridge University Press, Cambridge, 2nd edn., 1989.
2. D. Oelkrug, M. Fritz and H. Stauch, J. Electrochem. Soc., 139 (1992) 2419.
3. D. Oelkrug, S. Reich, F. Wilkinson and P.A. Leicester, J. Phys. Chem., 95 (1991) 269.
4. D. Oelkrug, M. Gregor and S. Reich, Photochem. Photobiol., 54 (1991) 539.
5. M. Abraham, J. Dütting, M. Schreck, R. Lege, S. Reich, D. Oelkrug and W. Göpel, J. Chem. Phys., 94 (1991) 3235.
6. H.-J. Egelhaaf, M. Brun, S. Reich and D. Oelkrug, J. Mol. Struct., 267 (1992) 297.
7. H.-J. Egelhaaf and D. Oelkrug, Proc. SPIE, 2362 (1995) 398.
8. D. Oelkrug, H.-J. Egelhaaf, J. Gierschner and A. Tompert, Synth. Met., 76 (1996) 249.