Atomic force microscopy of III-V nanostructures in air

Applied Surface Science

Volumn 104-105, Issue , 1996, Pages 529-538

  Reinhardt, F ^a   Dwir, B ^a   Biasiol, G ^a   Kapon, E ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; MONOLAYERS; NANOSTRUCTURED MATERIALS; OXIDES; SURFACE STRUCTURE;

GROWTH ISLANDS;

HETEROJUNCTIONS;

EID: 0030234595     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(96)00198-5     Document Type: Article

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