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Volumn 81, Issue 3, 1996, Pages 303-317

Surface characterization of plasma deposited organic thin films

Author keywords

Contact angle; FTIR; Organic thin film; Plasma modification; SIMS; XPS

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL MODIFICATION; CONTACT ANGLE; CROSSLINKING; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MOLECULAR ORIENTATION; ORGANIC COMPOUNDS; PLASMAS; SECONDARY ION MASS SPECTROMETRY; SURFACES; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0030234445     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/0368-2048(95)02666-5     Document Type: Article
Times cited : (78)

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    • Briggs, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.