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Volumn 284-285, Issue , 1996, Pages 381-386

In-situ and ex-situ structural analysis of phospholipid-supported planar bilayers using infrared spectroscopy and atomic force microscopy

Author keywords

Atomic force microscopy; Infrared spectroscopy; Phospholipids; Planar bilayers

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; INFRARED SPECTROSCOPY; LANGMUIR BLODGETT FILMS; LIPIDS; SIGNAL TO NOISE RATIO; SINGLE CRYSTALS; X RAY CRYSTALLOGRAPHY;

EID: 0030234397     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(95)08347-2     Document Type: Article
Times cited : (25)

References (28)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.