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Volumn 104-105, Issue , 1996, Pages 286-290
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Intrinsic surface atom manipulations in STM and AFM
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTAL ATOMIC STRUCTURE;
SCANNING TUNNELING MICROSCOPY;
SURFACE PROPERTIES;
SURFACE STRUCTURE;
DIMERS;
SEMICONDUCTING SILICON;
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EID: 0030234360
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(96)00159-6 Document Type: Article |
Times cited : (5)
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References (17)
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