Dependence of crystalline structure and lattice parameters on film thickness in PbTiO3/Pt/MgO epitaxial structure

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 35, Issue 9 SUPPL. B, 1996, Pages 4913-4918

  Fujisawa, Hironori ^a,b   Shimizu, Masaru ^a   Horiuchi, Toshihisa ^b   Shiosaki, Tadashi ^b   Matsushige, Kazumi ^b  

^a UNIVERSITY OF HYOGO   (Japan)

^b KYOTO UNIVERSITY   (Japan)

Author keywords

Crystalline structure; Epitaxial growth; Film thickness; In plane; Lattice parameter; PbTiO3; Strain; Stress; Total reflection; X ray diffraction

Indexed keywords

FILM THICKNESS; LATTICE PARAMETER; TOTAL REFLECTION;

CRYSTALLINE MATERIALS; EPITAXIAL GROWTH; EXPERIMENTS; LATTICE CONSTANTS; REFLECTION; X RAY DIFFRACTION;

METALLIC FILMS;

EID: 0030234167     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.35.4913     Document Type: Article

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