Optimal line fitting and reliability evaluation

IEICE Transactions on Information and Systems

Volumn E79-D, Issue 9, 1996, Pages 1317-1322

  Kanazawa, Yasushi ^a   Kanatanj, Kenichi ^a  

^a GUNMA NATIONAL COLLEGE OF TECHNOLOGY   (Japan)

Author keywords

Edge detection; Image processing; Line fitting; Optimization technique; Reliability evaluation; Statistical model of noise

Indexed keywords

APPROXIMATION THEORY; COMPUTATIONAL METHODS; EDGE DETECTION; MATHEMATICAL MODELS; OPTIMIZATION; PATTERN RECOGNITION; RELIABILITY; STATISTICAL METHODS;

ASYMPTOTIC APPROXIMATION; RENORMALIZATION; STATISTICAL NOISE MODEL;

IMAGE PROCESSING;

EID: 0030233897     PISSN: 09168532     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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