Measurement system for electric field-induced strain by use of displacement magnification technique

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 35, Issue 9 SUPPL. B, 1996, Pages 5168-5173

  Saito, Yasuyoshi ^a  

^a Rd Management Section   (Japan)

Author keywords

Displacement magnification technique; Field induced strain; High electric field; Instrumentation; Piezoelectric d33 coefficient

Indexed keywords

DISPLACEMENT MAGNIFICATION TECHNIQUE; FIELD-INDUCED STRAIN; HIGH ELECTRIC FIELD;

ACOUSTIC EMISSIONS; ELECTRIC FIELDS; ELECTRIC MEASURING INSTRUMENTS; ELECTRIC VARIABLES MEASUREMENT; STRAIN;

PIEZOELECTRIC DEVICES;

EID: 0030233579     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.35.5168     Document Type: Article

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