Characterization of precipitates with the atom probe

Journal De Physique. IV : JP

Volumn 6, Issue 5, 1996, Pages 277-282

  Miller, M K ^a   Thomson, R C ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CALCULATIONS; CHARACTERIZATION; CHEMICAL ANALYSIS; COMPOSITION; COMPUTER SIMULATION; GEOMETRY; MATHEMATICAL MODELS; PROBES; SUPERALLOYS;

ATOM PROBES; ION MICROGRAPHS; NICKEL BERYLLIUM ALLOYS; PLATELETS; PRECIPITATES; RANDOM AREA ANALYSIS;

NICKEL ALLOYS;

EID: 0030232603     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:1996545     Document Type: Article

References (3)