메뉴 건너뛰기




Volumn 379, Issue 3, 1996, Pages 390-392

BELLE silicon vertex detector

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC VARIABLES MEASUREMENT; OPTIMIZATION; PERFORMANCE; SEMICONDUCTING SILICON; SIGNAL TO NOISE RATIO; SILICON SENSORS; SPURIOUS SIGNAL NOISE; STRIP METAL;

EID: 0030231978     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(96)00594-3     Document Type: Article
Times cited : (2)

References (7)
  • 3
    • 0042291988 scopus 로고
    • BELLE Collaboration, KEK Proc. 95-1 (1995).
    • (1995) KEK Proc. 95-1
  • 4
    • 0004156678 scopus 로고
    • April March
    • BELLE Collaboration, Progress Report, April 1995-March 1996.
    • (1995) Progress Report
  • 5
    • 24244463153 scopus 로고    scopus 로고
    • 2nd Int. Symp. on development and application of semiconductor tracking detectors, Hiroshima, Japan, Oct. 1995
    • to be published
    • M. Hazumi et al., presented at 2nd Int. Symp. on Development and Application of Semiconductor Tracking Detectors, Hiroshima, Japan, Oct. 1995. to be published in Nucl. Instr. and Meth. A.
    • Nucl. Instr. and Meth. A
    • Hazumi, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.