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Volumn 32, Issue 1-4 SPEC. ISS., 1996, Pages 159-171

Nanofabrication by FIB

Author keywords

FIB systems; Nanofabrication

Indexed keywords

FOCUSING; ION BEAM LITHOGRAPHY; ION IMPLANTATION; NANOTECHNOLOGY; PATTERN RECOGNITION; QUANTUM ELECTRONICS;

EID: 0030231711     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/0167-9317(96)00003-2     Document Type: Article
Times cited : (61)

References (39)
  • 13
    • 30244434452 scopus 로고
    • Cambridge Univ., Engineering Dept. Report No. CUED/BELECT/TR 45
    • E. Munro, Cambridge Univ., Engineering Dept. Report No. CUED/BELECT/TR 45, 1975.
    • (1975)
    • Munro, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.