Characterization of surface damage via contact probes

Nanotechnology

Volumn 7, Issue 3, 1996, Pages 288-294

  Warren, P D ^a,b   Kolosov, O V ^a   Roberts, S G ^a   Briggs, G A D ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b UNIVERSITY OF LEEDS   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BRITTLENESS; CRACKS; MACHINING; MICROSCOPIC EXAMINATION; POLISHING;

CHEMICAL DAMAGE; SURFACE CONTAMINATION; ULTRASONIC FORCE MICROSCOPY (UFM);

SURFACES;

EID: 0030231428     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/7/3/019     Document Type: Article

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