SCOPUS 정보 검색 플랫폼

Volumn 166, Issue 1-4, 1996, Pages 792-797

Characterization of cobalt films grown on MgO(001) by dc-biased-sputter deposition

(7) Hashimoto, Mituru a Qiu, Hong a Ohbuchi, Tatsuya a Adamik, Miklos b Nakai, Hisashi a Barna, Arpad b Barna, Peter B b

a UNIVERSITY OF ELECTRO COMMUNICATIONS (Japan)

b RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; COBALT; CRYSTAL LATTICES; DISLOCATIONS (CRYSTALS); ELECTRIC CONDUCTIVITY OF SOLIDS; FILM GROWTH; MAGNETIZATION; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SPUTTER DEPOSITION; STRESS RELAXATION; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

LATTICE EXPANSION; PARTIAL LATTICE DISTORTIONS; RESISTIVITY TEMPERATURE COEFFICIENT; SATURATION MAGNETIZATION;

THIN FILMS;

EID: 0030231264 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/0022-0248(95)00495-5 Document Type: Article

Times cited : (14)

References (14)

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