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Volumn 166, Issue 1-4, 1996, Pages 303-308

Use of optical diffraction effects in crystals for growth characterization

Author keywords

[No Author keywords available]

Indexed keywords

COLOR; CRYSTAL MICROSTRUCTURE; ELECTROMAGNETIC WAVE DIFFRACTION; INTERFACES (MATERIALS); OPTICAL PROPERTIES; STABILITY;

EID: 0030231227     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-0248(96)00067-X     Document Type: Article
Times cited : (5)

References (7)
  • 6
    • 30244486789 scopus 로고
    • Defect recognition and image processing in semiconductors and devices
    • Ed. J. Jiminez Inst. of Physics, Bristol
    • J. Donecker, in: Defect Recognition and Image Processing in Semiconductors and Devices, Inst. Phys. Conf. Ser. No. 135, Ed. J. Jiminez (Inst. of Physics, Bristol, 1994) p. 311.
    • (1994) Inst. Phys. Conf. Ser. , vol.135 , pp. 311
    • Donecker, J.1
  • 7
    • 3843096390 scopus 로고
    • Eds. G. Gouesbet and A. Berlemont Pergamon, New York
    • A.P. Guskov, in: Instabilities in Multiphase Flows, Eds. G. Gouesbet and A. Berlemont (Pergamon, New York, 1993) p. 25.
    • (1993) Instabilities in Multiphase Flows , pp. 25
    • Guskov, A.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.