Characterization of CdTe : Cl crystals grown under microgravity conditions by time dependent charge measurements (TDCM)

Journal of Crystal Growth

Volumn 166, Issue 1-4, 1996, Pages 245-250

  Eiche, C ^a   Joerger, W ^a   Fiederle, M ^a   Ebling, D ^a   Salk, M ^a   Schwarz, R ^a   Benz, K W ^a  

^a UNIVERSITY OF FREIBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COOLING; CRYSTAL GROWTH FROM MELT; DEEP LEVEL TRANSIENT SPECTROSCOPY; ELECTRIC CONDUCTIVITY MEASUREMENT; LAMINAR FLOW; MICROGRAVITY PROCESSING; VAPOR PHASE EPITAXY;

PHOTO INDUCED CURRENT TRANSIENT SPECTROSCOPY (PICTS); TIME DEPENDENT CHARGE MEASUREMENTS (TDCM);

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0030230367     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-0248(96)00071-1     Document Type: Article

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