In situ observation of phase changes by X-ray diffraction in the Bi-Sr-Ca-Cu-O system

Journal of Crystal Growth

Volumn 166, Issue 1-4, 1996, Pages 872-877

  Suzuki, Takuya ^a   Yumoto, Ken Ich ^b   Hasegawa, Masashi ^a   Takei, Humihiko ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b TOYO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; CRYSTAL GROWTH; DECOMPOSITION; OPTICAL MICROSCOPY; OXIDE SUPERCONDUCTORS; PHASE TRANSITIONS; SUPERCONDUCTING TRANSITION TEMPERATURE; THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS; X RAY POWDER DIFFRACTION;

BISMUTH BASED SUPERCONDUCTORS; POSITIVE SENSITIVE PROPORTIONAL COUNTER;

SUPERCONDUCTING MATERIALS;

EID: 0030230364     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-0248(95)00534-X     Document Type: Article

References (7)

1. H. Komatsu, Y. Kato, S. Miyashita, T. Inoue and S. Hayashi, Physica C 190 (1991) 14.
2. P. Strobel and T. Fournier, J. Less-Common Met. 164/165 (1990) 519.
3. T. Hasegawa, H. Kobayashi, H, Kumakura, H. Kitaguchi and K. Togano, Physica C 222 (1994) 111.
4. H. Takei, M. Koike, H. Takeya, K. Suzuki and M. Ichihara, Jpn. J. Appl. Phys. 28 (1989) 1193.
5. Y. Oyama, M. Hasegawa and H. Takei, Jpn. J. Appl. Phys. 33 (1994) 4779.
6. Y. Oyama, M. Hasegawa and H. Takei, J. Crystal Growth 143 (1994) 200.
7. Y. Oyama, H. Yabashi, M. Hasegawa and H. Takei, Ferroelectrics 152 (1994) 361.