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Volumn 166, Issue 1-4, 1996, Pages 848-853
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Structural characterization of superconducting Y-Ba-Cu-O thin films, prepared by pulsed electron beam evaporation
a
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Author keywords
[No Author keywords available]
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Indexed keywords
COPPER OXIDES;
CRYSTAL ORIENTATION;
CRYSTAL STRUCTURE;
EPITAXIAL GROWTH;
FILM GROWTH;
INTERFACES (MATERIALS);
MORPHOLOGY;
SCANNING ELECTRON MICROSCOPY;
SURFACE ROUGHNESS;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
DEPOSITION FREQUENCY;
ELECTRON BEAM EVAPORATION;
PHASE STABILITY;
SUBSTRATE TEMPERATURE;
SUPERCONDUCTING FILMS;
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EID: 0030230276
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/0022-0248(96)00054-1 Document Type: Article |
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Times cited : (2)
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References (12)
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