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Volumn 50, Issue 9, 1996, Pages 1175-1181

Matrix effects in the detection of Pb and Ba in soils using laser-induced breakdown spectroscopy

Author keywords

Atomic emission spectroscopy; Laser microprobe; Laser induced breakdown spectroscopy; LIBS; Soil analysis

Indexed keywords

ATOMIC SPECTROSCOPY; BARIUM; CARRIER CONCENTRATION; CHEMICAL ANALYSIS; CRYSTALLINE MATERIALS; EMISSION SPECTROSCOPY; LASER BEAM EFFECTS; LASER PULSES; LEAD; SAND;

EID: 0030230099     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702963905123     Document Type: Article
Times cited : (264)

References (26)
  • 1
    • 85033003420 scopus 로고    scopus 로고
    • Agency for Toxic Substances and Disease Registry Public Health Service, U.S. Department of Health and Human Services (1994)
    • Agency for Toxic Substances and Disease Registry Public Health Service, U.S. Department of Health and Human Services (1994).
  • 2
    • 0039402339 scopus 로고
    • 2 Spectrometer for Field Screening of Hazardous Metal Wastes
    • C. S. Barrett, J. V. Gilfrich, T. C. Huang, R. Jenkins, G. L. McCarthy, P. K. Predecki, R. Ryon, and D. K. Smith, Eds. Plenum Press, New York
    • 2 Spectrometer for Field Screening of Hazardous Metal Wastes", in Advances in X-ray Analysis, C. S. Barrett, J. V. Gilfrich, T. C. Huang, R. Jenkins, G. L. McCarthy, P. K. Predecki, R. Ryon, and D. K. Smith, Eds. (Plenum Press, New York, 1992), Vol. 35, pp. 1047-1053.
    • (1992) Advances in X-ray Analysis , vol.35 , pp. 1047-1053
    • Bernick, M.1    Berry, P.F.2    Voots, G.R.3    Prince, G.4    Ashe, J.B.5    Patel, J.6    Gupta, P.7
  • 3
    • 5944228944 scopus 로고
    • XRF Technique as a Method of Choice for On-Site Analysis of Soil Contaminants and Waste Material
    • C. S. Barrett, J. V. Gilfrich, T. C. Huang, R. Jenkins, and P. K. Predecki, Eds. Plenum Press, New York
    • S. Piorek, "XRF Technique as a Method of Choice for On-Site Analysis of Soil Contaminants and Waste Material", in Advances in X-ray Analysis, C. S. Barrett, J. V. Gilfrich, T. C. Huang, R. Jenkins, and P. K. Predecki, Eds. (Plenum Press, New York, 1990), Vol. 33, pp. 639-645.
    • (1990) Advances in X-ray Analysis , vol.33 , pp. 639-645
    • Piorek, S.1
  • 18
    • 0003449101 scopus 로고
    • University Science Books, Mill Valley, California, Appendix C
    • J. R. Taylor, Introduction to Error Analysis (University Science Books, Mill Valley, California, 1982), Appendix C.
    • (1982) Introduction to Error Analysis
    • Taylor, J.R.1
  • 24
    • 0002203403 scopus 로고
    • Evaluation of Plasma Parameters
    • W. Lochte-Holtgreven, Ed. North Holland Publishing Company, Amsterdam
    • W. Lochte-Holtgreven "Evaluation of Plasma Parameters", in Plasma Diagnostics, W. Lochte-Holtgreven, Ed. (North Holland Publishing Company, Amsterdam, 1968), p. 149.
    • (1968) Plasma Diagnostics , pp. 149
    • Lochte-Holtgreven, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.