Induction of Repair Capacity for Oxidatively Damaged DNA as a Component of Peroxide Stress Response in Escherichia coli

Journal of Radiation Research

Volumn 37, Issue 3, 1996, Pages 171-176

  Zhang, Qiu Mei ^a   Takemoto, Tadashi ^a   Mito, Seiji ^a,b   Yonei, Shuji ^a  

^a KYOTO UNIVERSITY   (Japan)

^b Tanabe Sciyaku Co   (Japan)

Author keywords

Escherichia coli; Host cell reactivation; Induction of repair activity; Peroxide stress; X ray sensitivity

Indexed keywords

CELLS; CYTOLOGY; DNA; OXIDATION; REPAIR;

E. COLI; ESCHERICHIA COLI CELLS; HOST CELL REACTIVATION; HOST CELLS; INDUCTION OF REPAIR ACTIVITY; PEROXIDE STRESS; REPAIR CAPACITIES; STRESSES RESPONSE; WILD-TYPE STRAIN; X-RAY SENSITIVITY;

ESCHERICHIA COLI;

ESCHERICHIA COLI;

BACTERIAL DNA; HYDROGEN PEROXIDE;

ARTICLE; BACTERIOPHAGE LAMBDA; DNA DAMAGE; DNA REPAIR; ESCHERICHIA COLI; GENETICS; METABOLISM; MUTATION; OXIDATIVE STRESS; RADIATION EXPOSURE;

BACTERIOPHAGE LAMBDA; DNA DAMAGE; DNA REPAIR; DNA, BACTERIAL; ESCHERICHIA COLI; HYDROGEN PEROXIDE; MUTATION; OXIDATIVE STRESS;

EID: 0030227739     PISSN: 04493060     EISSN: None     Source Type: Journal    
DOI: 10.1269/jrr.37.171     Document Type: Article

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