Effect of silicone vapour concentration and its polymerization degree on electrical contact failure

IEICE Transactions on Electronics

Volumn E79-C, Issue 8, 1996, Pages 1137-1142

  Tamai, Terutaka ^a   Aramata, Mikio ^b  

^a HYOGO UNIVERSITY OF TEACHER EDUCATION   (Japan)

^b SHIN ETSU CHEMICAL CO LTD   (Japan)

Author keywords

Contact failure; Electrical contacts; Polymerization degree; Silicone; Silicone contamination; Silicone vapour

Indexed keywords

CONTAMINATION; ELECTRIC COMMUTATORS; ELECTRIC CONTACTS; ELECTRIC RESISTANCE; EVAPORATION; FAILURE ANALYSIS; POLYMERIZATION; SILICA; SILICONES; VAPORS; X RAY PHOTOELECTRON SPECTROSCOPY;

FILM THICKNESS; MICRORELAYS; MOTOR BRUSH SLIP RING; SILICONE VAPOUR CONCENTRATION;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 0030219315     PISSN: 09168524     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (8)

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