Preparation of nanometer-size dispersions of iron in sapphire by ion implantation and annealing

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 116, Issue 1-4, 1996, Pages 173-177

  McHargue, Carl J ^a   Ren, Shelly X ^a   Sklad, P S ^b   Allard, L F ^b   Hunn, John ^b  

^a UNIVERSITY OF TENNESSEE   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COLLOIDS; CRYSTAL DEFECTS; DISPERSIONS; ELECTRON DIFFRACTION; ION IMPLANTATION; NANOSTRUCTURED MATERIALS; PARTICLE SIZE ANALYSIS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SAPPHIRE; TRANSMISSION ELECTRON MICROSCOPY;

ION CHANNELING; METALLIC COLLOIDS; NANOMETER SIZE DISPERSIONS;

IRON;

EID: 0030219151     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(96)00123-1     Document Type: Article

References (5)

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3. H. Siedentopf, Z. Physik 6 (1905) 855.
4. F. Agullo-Lopez, C.R.A. Catlow and P.D. Townsend, Point Defects in Materials (Academic Press, London, 1988) pp. 134-137.
5. S.X. Ren, C.J. McHargue, L.F. Allard, Y. Chen, J.D. Hunn, B.N. Lucas and R.K. Williams, Mat. Res. Soc. Symp. Proc. 373 (1995) 305.