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Volumn 281-282, Issue 1-2, 1996, Pages 536-538
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Plasma polymerized acetylene thin film by pulsed discharge
a a a a |
Author keywords
Acetylene; Growth mechanism; Optical spectroscopy; Plasma processing and deposition
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Indexed keywords
ARGON;
COMPOSITION;
DEPOSITION;
ELLIPSOMETRY;
EMISSION SPECTROSCOPY;
FILM GROWTH;
PLASMA APPLICATIONS;
POLYMERIZATION;
SILICON WAFERS;
THICKNESS MEASUREMENT;
THIN FILMS;
ULTRATHIN FILMS;
ELLIPSOMETER;
GAS DISCHARGE;
OPTICAL SPECTROSCOPY;
PLASMA POLYMERIZATION;
PULSED RF DISCHARGE;
X RAY PHOTOEMISSION SPECTROSCOPY;
ACETYLENE;
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EID: 0030218508
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/0040-6090(96)08725-1 Document Type: Article |
Times cited : (9)
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References (4)
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