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Volumn 116, Issue 1-4, 1996, Pages 274-278

Swift atomic ion irradiation of C60 films: Dependence of the damage cross section on the primary ion stopping power

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL MODIFICATION; ENERGY DISSIPATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; ION BOMBARDMENT; SURFACE ROUGHNESS; THIN FILMS; VELOCITY;

EID: 0030218182     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(96)00060-2     Document Type: Article
Times cited : (14)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.