Growth kinetics of thin oxide layers; oxidation of Fe and Fe-N phases at room temperature

Thin Solid Films

Volumn 281-282, Issue 1-2, 1996, Pages 488-491

  Kooi, Bart J ^a,b   Somers, Marcel A J ^a   Mittemeijer, Eric J ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

Auger electron spectroscopy; Iron; Nitrides; Oxidation

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRON TUNNELING; ELECTRONS; ELECTROSTATICS; IONS; IRON; NITRIDES; OXIDATION; OXIDES; POLYCRYSTALLINE MATERIALS; REACTION KINETICS; THIN FILMS;

CATION; ELECTROSTATIC POTENTIAL DIFFERENCE; ROOM TEMPERATURE;

FILM GROWTH;

EID: 0030217675     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(96)08682-8     Document Type: Article

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