메뉴 건너뛰기




Volumn 3, Issue 4, 1996, Pages 494-498

Silicon-based inorganic electrets for application in micromachined devices

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; ELECTRIC CHARGE; ELECTRIC CURRENTS; ELECTRIC FIELDS; INORGANIC COMPOUNDS; MICROPHONES; MULTILAYERS; SILICA; SILICON NITRIDE; SURFACE PHENOMENA;

EID: 0030217508     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/94.536727     Document Type: Article
Times cited : (40)

References (11)
  • 1
    • 0021407848 scopus 로고
    • Silicon-dioxide Electret Transducers
    • D. Hohm, R. Gerhard-Multhaupt, "Silicon-dioxide Electret Transducers", J. Acoust. Soc. Am., Vol. 75, pp. 1297-1298, 1984.
    • (1984) J. Acoust. Soc. Am. , vol.75 , pp. 1297-1298
    • Hohm, D.1    Gerhard-Multhaupt, R.2
  • 3
    • 0026105472 scopus 로고
    • Mechanism of Charge Storage in Electron-beam or Corona-charged Silicon-dioxide Electrets
    • P. Guenther, "Mechanism of Charge Storage in Electron-beam or Corona-charged Silicon-dioxide Electrets", IEEE Transactions on Electrical Insulation, Vol. 26, pp. 42-48, 1991.
    • (1991) IEEE Transactions on Electrical Insulation , vol.26 , pp. 42-48
    • Guenther, P.1
  • 9
    • 0014438345 scopus 로고
    • Charge Storage Model for Variable Threshold FET Memory Element
    • F. A. Sewell, H. A. R. Wegener and E. T. Lewis, "Charge Storage Model for Variable Threshold FET Memory Element", Applied Physics Letters, Vol. 14, No. 2, pp. 45-47, 1969.
    • (1969) Applied Physics Letters , vol.14 , Issue.2 , pp. 45-47
    • Sewell, F.A.1    Wegener, H.A.R.2    Lewis, E.T.3
  • 10
    • 0014926483 scopus 로고
    • The Metal-Insulator-Oxide-Silicon (MNOS) Transistor - Characteristics and Applications
    • Dov Frohman-Bentchkowsky, "The Metal-Insulator-Oxide-Silicon (MNOS) Transistor - Characteristics and Applications", Proceedings of the IEEE, Vol. 58, No. 8, pp. 1207-1219, 1970.
    • (1970) Proceedings of the IEEE , vol.58 , Issue.8 , pp. 1207-1219
    • Frohman-Bentchkowsky, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.