Absolute vs. comparative end-of-life age

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 3, Issue 4, 1996, Pages 567-576

  Bruning, A M ^a   Kasture, D G ^a   Ascher, H E ^b  

^a Lectromechanical Design Company   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; AIRCRAFT MATERIALS; CALCULATIONS; ELECTRIC INSULATION TESTING; FAILURE ANALYSIS; INSULATED WIRE; PROBABILITY; RELIABILITY; SERVICE LIFE; STATISTICAL TESTS; STRESSES; WEIBULL DISTRIBUTION;

AIRCRAFT WIRE; END OF LIFE; INSULATION AGING; ROOT CAUSE STRESSES;

ELECTRIC INSULATION;

EID: 0030217454     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/94.536737     Document Type: Review

References (5)

1. "Aircraft Wiring Analysis Program - Readiness, Reliability and Maintainability Impact Report", Twelve month report 1990 prepared by Aircraft Wiring Engineering Systems Branch (Code 916), Naval Avionics Center, Indianapolis, Indiana, 1990.
2. "IEEE Guide for the Statistical Analysis of Thermal Life Test Data", American National Standard ANSI/IEEE Std. 101/1987.
3. A. M. Bruning and F. J. Campbell, "Aging in Wire Insulation under Multifactor Stress", IEEE Transactions on Electrical Insulation, Vol. 28, No. 5, (page 742, Figure 17), 1993.
4. "IEEE Guide for the Statistical Analysis of Electrical Insulation Voltage Endurance Data", American National Standard ANSI/IEEE Std. 930/1987.
5. F. J. Campbell and A. M. Bruning, "Insulation Aging from Simultaneous Mechanical Strain, Polymer-chemical, and Temperature Interactions", International Conference on Electrical Insulation, Baltimore, MD, June 7-8, 1992.