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Advanced Materials

Volumn 8, Issue 8, 1996, Pages 654-657

Scanning probe microscopy of polymeric methyltrioxorhenium

(5) Mattner, Mike R a Herrmann, Wolfgang A a Berger, Rüdiger b,c Gerber, Christoph b Gimzewski, Jim K b

a TECHNICAL UNIVERSITY OF MUNICH (Germany)

b IBM RESEARCH ZURICH (Switzerland)

c UNIVERSITY OF BASEL (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CALIBRATION; CRYSTAL GROWTH; CRYSTALLINE MATERIALS; ELECTRIC CONDUCTIVITY; HYDROGEN BONDS; INTERCALATION COMPOUNDS; MOLECULAR STRUCTURE; PRESSURE EFFECTS; SCANNING TUNNELING MICROSCOPY; SURFACE ROUGHNESS; THERMAL EFFECTS;

DEPOLYMERIZATION; GRAY SCALE IMAGE; METHYLTRIOXORHENIUM; SCANNING FORCE MICROSCOPY; SCANNING PROBE MICROSCOPY;

METALLORGANIC POLYMERS;

EID: 0030217445 PISSN: 09359648 EISSN: None Source Type: Journal
DOI: 10.1002/adma.19960080811 Document Type: Article

Times cited : (7)

References (8)

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2
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5
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- Fischer, R.W.¹

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8
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- Ph.D. thesis, Technische Universität München, Germany
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- Scherer, W.¹

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