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Volumn 32, Issue 18, 1996, Pages 1674-1675
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Solid source molecular beam epitaxy of low threshold strained layer 1.3μm InAsP/GaInAsP lasers
a a a |
Author keywords
Molecular beam epitaxial growth; Semiconductor junction lasers; Semiconductor quantum wells
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Indexed keywords
CURRENT DENSITY;
EPITAXIAL GROWTH;
ETCHING;
MOLECULAR BEAM EPITAXY;
PHOTOLUMINESCENCE;
SEMICONDUCTING GALLIUM COMPOUNDS;
SEMICONDUCTING INDIUM COMPOUNDS;
SEMICONDUCTOR DEVICE STRUCTURES;
SEMICONDUCTOR DEVICE TESTING;
SEMICONDUCTOR QUANTUM WELLS;
SILICON WAFERS;
SUBSTRATES;
MOLECULAR BEAM EPITAXIAL GROWTH;
SEMICONDUCTOR JUNCTION LASERS;
SOLID SOURCE MOLECULAR BEAM EPITAXY;
WET ETCHING;
SEMICONDUCTOR LASERS;
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EID: 0030217301
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el:19961090 Document Type: Article |
Times cited : (11)
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References (6)
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