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Volumn 116, Issue 1-4, 1996, Pages 347-354

Positron annihilation and ESR study of irradiation-induced defects in silica glass

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL DEFECTS; ELECTRON SPECTROSCOPY; ELECTRON SPIN RESONANCE SPECTROSCOPY; ELECTRONIC STRUCTURE; NEUTRON IRRADIATION;

EID: 0030217285     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(96)00070-5     Document Type: Article
Times cited : (29)

References (27)
  • 3
    • 0000206815 scopus 로고
    • eds. D.R. Uhlmann and N.J. Kreidl, Academic Press, Boston
    • D.L. Griscom, Glass Science and Technology, eds. D.R. Uhlmann and N.J. Kreidl, Vol. 4B (Academic Press, Boston, 1990) p. 151.
    • (1990) Glass Science and Technology , vol.4 B , pp. 151
    • Griscom, D.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.