Wavelength detector using a pair of metal-semiconductor-metal photodetectors with subwavelength finger spacings

Electronics Letters

Volumn 32, Issue 16, 1996, Pages 1510-1511

  Chen, E ^a   Chou, S Y ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; ELECTRIC CURRENTS; FABRICATION; LIGHT; MONOLITHIC INTEGRATED CIRCUITS; OPTICAL DESIGN; OPTICAL RESOLVING POWER; PERFORMANCE; RESONANCE; SEMICONDUCTOR METAL BOUNDARIES;

FINGER SPACINGS; METAL SEMICONDUCTOR METAL STRUCTURES; PHOTOCURRENT RATIO; PHOTOCURRENTS; SPECTRAL RANGE; WAVELENGTH; WAVELENGTH CALIBRATION; WAVELENGTH DETECTORS;

PHOTODETECTORS;

EID: 0030217032     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19960964     Document Type: Article

References (12)