Time and frequency domain analysis of integral decoupling capacitors

IEEE Transactions on Components Packaging and Manufacturing Technology Part B

Volumn 19, Issue 3, 1996, Pages 518-522

  Goetz, Martin P ^a,b  

^a IEEE

^b ASAT Inc   (United States)

Author keywords

Decoupling capacitors; Frequency domain; Measurement techniques; Packaging; Switching noise; Thin film substrate; Time domain

Indexed keywords

COMPUTER SIMULATION; ELECTRIC VARIABLES MEASUREMENT; ELECTRONICS PACKAGING; FREQUENCY DOMAIN ANALYSIS; SPURIOUS SIGNAL NOISE; SURFACE MOUNT TECHNOLOGY; THIN FILMS; TIME DOMAIN ANALYSIS;

HIGH SPEED PACKAGING SYSTEMS; INTEGRAL DECOUPLING CAPACITORS; SIMULTANEOUS SWITCHING NOISE;

CAPACITORS;

EID: 0030216689     PISSN: 10709894     EISSN: None     Source Type: Journal    
DOI: 10.1109/96.533890     Document Type: Article

References (11)

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