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Volumn 38, Issue 9, 1996, Pages 46-47
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Optical microscopy closes in on single-atom resolution
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ATOMS;
FOCUSING;
IMAGING SYSTEMS;
INTERFEROMETERS;
LASER BEAMS;
LIGHT ABSORPTION;
LIGHT TRANSMISSION;
OPTICAL RESOLVING POWER;
OPTICS;
SCANNING;
VAN DER WAALS FORCES;
ATOMIC LEVEL DISTANCES;
SINGLE ATOMS;
VIBRATING CANTILEVER;
OPTICAL MICROSCOPY;
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EID: 0030216209
PISSN: 07469179
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
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Times cited : (2)
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References (0)
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