Dielectric properties of Ta2O5-SiO2 polycrystalline ceramics

Journal of Applied Physics

Volumn 80, Issue 4, 1996, Pages 2346-2348

  Cava, R J ^a   Krajewski, J J ^a   Peck Jr , W F ^a   Roberts, G L ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; MATHEMATICAL MODELS; NATURAL FREQUENCIES; OXIDES; POLYCRYSTALLINE MATERIALS; SOLID SOLUTIONS; THERMAL EFFECTS; TITANIUM DIOXIDE; X RAY POWDER DIFFRACTION;

DIELECTRIC CONSTANTS; DISSIPATION FACTOR; TANTALUM OXIDE; TEMPERATURE COEFFICIENT;

CERAMIC MATERIALS;

EID: 0030215966     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363068     Document Type: Article

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