메뉴 건너뛰기




Volumn 32, Issue 17, 1996, Pages 1616-1618

Impact ionisation and noise in SiGe multiquantum well structures

(3)  Herbert, D C a   Williams, C J a   Jaros, M a  

a NONE

Author keywords

Impact ionisation; Semiconductor quantum wells

Indexed keywords

AVALANCHE DIODES; ELECTROMAGNETIC WAVE SCATTERING; HOT CARRIERS; IONIZATION OF SOLIDS; SEMICONDUCTING SILICON COMPOUNDS;

EID: 0030215941     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19961035     Document Type: Article
Times cited : (9)

References (10)
  • 2
    • 5644253803 scopus 로고    scopus 로고
    • Thesis, University of Newcastle-upon-Tyne
    • WILLIAMS, C.J.: Thesis, University of Newcastle-upon-Tyne, 1996
    • (1996)
    • Williams, C.J.1
  • 3
    • 0026961211 scopus 로고
    • A model for transient impact ionisation
    • HERBERT, D.C.: 'A model for transient impact ionisation', Compel, 1992, 11, (4), pp. 413-418
    • (1992) Compel , vol.11 , Issue.4 , pp. 413-418
    • Herbert, D.C.1
  • 5
    • 0027699247 scopus 로고
    • Breakdown voltage in ultra-thin pin diodes
    • HERBERT, D.C.: 'Breakdown voltage in ultra-thin pin diodes', Semicond. Sci. Technol., 1993, 8, (11), pp. 1993-1998
    • (1993) Semicond. Sci. Technol. , vol.8 , Issue.11 , pp. 1993-1998
    • Herbert, D.C.1
  • 6
    • 0001362288 scopus 로고
    • Impact ionization coefficient and energy distribution function in polar and nonpolar semiconductors
    • M-CHO, S., and LEE, H.H.: 'Impact ionization coefficient and energy distribution function in polar and nonpolar semiconductors', J. Appl. Phys., 1992, 71, (5), pp. 1298-1305
    • (1992) J. Appl. Phys. , vol.71 , Issue.5 , pp. 1298-1305
    • M-Cho, S.1    Lee, H.H.2
  • 8
    • 0029632597 scopus 로고
    • Impact ionisation in Si bipolar devices
    • HERBERT, D.C.: 'Impact ionisation in Si bipolar devices', Electron. Lett., 1995, 31, (5) pp. 334-335
    • (1995) Electron. Lett. , vol.31 , Issue.5 , pp. 334-335
    • Herbert, D.C.1
  • 9
    • 0026866665 scopus 로고
    • Lucky drift estimation of excess noise factor for conventional avalanche photodiodes including the dead space effect
    • MARSLAND, J.S., WOODS, R.C., and BROWNHILL, C.A.: 'Lucky drift estimation of excess noise factor for conventional avalanche photodiodes including the dead space effect', IEEE Trans., 1992, ED-39, (5), pp. 1129-1135
    • (1992) IEEE Trans. , vol.ED-39 , Issue.5 , pp. 1129-1135
    • Marsland, J.S.1    Woods, R.C.2    Brownhill, C.A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.