Measurement of material shielding effectiveness using a dual TEM cell and vector network analyzer

IEEE Transactions on Electromagnetic Compatibility

Volumn 38, Issue 3, 1996, Pages 327-333

  Manara, Angelo ^a  

^a CESI   (Italy)

Author keywords

Dual TEM cell; Shielding effectiveness; Shielding material; Small aperture coupling

Indexed keywords

ELECTRIC NETWORK ANALYZERS; ELECTROMAGNETIC FIELD MEASUREMENT; ELECTROMAGNETIC WAVE POLARIZATION; ELECTROMAGNETIC WAVE SCATTERING; MATERIALS TESTING;

APERTURE POLARIZABILITIES; PLANE WAVE SIMULATION METHODS; SMALL APERTURE COUPLING; SMALL APERTURE THEORY; VECTOR NETWORK ANALYZERS;

ELECTROMAGNETIC SHIELDING;

EID: 0030215921     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/15.536062     Document Type: Article

References (12)

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