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Volumn 364, Issue 1, 1996, Pages 39-53
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A resistance network representation of electrical conduction in Pt and Cu films
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Author keywords
Copper; Electrical transport measurements; Metallic films; Platinum; Polycrystalline thin films; Semi empirical models and model calculations
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Indexed keywords
AMORPHOUS MATERIALS;
COPPER;
CRYSTAL ATOMIC STRUCTURE;
ELECTRIC CONDUCTIVITY;
FILM GROWTH;
ION BEAMS;
MATHEMATICAL MODELS;
PLATINUM;
SPUTTERING;
SURFACE PHENOMENA;
THIN FILMS;
TRANSPORT PROPERTIES;
ELECTRICAL CONDUCTION;
ELECTRICAL TRANSPORT MEASUREMENTS;
ION BEAM SPUTTERING;
NEGATIVE TEMPERATURE COEFFICIENT;
POLYCRYSTALLINE THIN FILMS;
METALLIC FILMS;
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EID: 0030215681
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/0039-6028(96)00589-4 Document Type: Article |
Times cited : (3)
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References (21)
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