메뉴 건너뛰기




Volumn 364, Issue 1, 1996, Pages 39-53

A resistance network representation of electrical conduction in Pt and Cu films

Author keywords

Copper; Electrical transport measurements; Metallic films; Platinum; Polycrystalline thin films; Semi empirical models and model calculations

Indexed keywords

AMORPHOUS MATERIALS; COPPER; CRYSTAL ATOMIC STRUCTURE; ELECTRIC CONDUCTIVITY; FILM GROWTH; ION BEAMS; MATHEMATICAL MODELS; PLATINUM; SPUTTERING; SURFACE PHENOMENA; THIN FILMS; TRANSPORT PROPERTIES;

EID: 0030215681     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00589-4     Document Type: Article
Times cited : (3)

References (21)
  • 21
    • 0042011321 scopus 로고
    • PhD thesis, University of Reading, UK
    • Shi Xu, PhD thesis, University of Reading, UK, 1990.
    • (1990)
    • Xu, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.